JLab Signal Distribution Switch Slot module
A5
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Functions | |
int | sdTestGetBusyout () |
Return the mask of busy's asserted from the payload ports. More... | |
int | sdTestGetSdLink () |
Return the asserted level from the TI over the SDlink. More... | |
int | sdTestGetTokenIn () |
Return payload port mask of those payload modules asserting TokenIN. More... | |
int | sdTestGetTrigOut () |
Return payload port mask of those payload modules asserting TrigOUT. More... | |
void | sdTestSetTokenOutMask (int mask) |
Set TokenOUT levels HI to those payload ports specified in mask. More... | |
void | sdTestSetStatBitBMask (int mask) |
Set StatBitB levels HI to those payload ports specified in mask. More... | |
void | sdTestSetClkAPLL (int mode) |
Set the PLL mode for Clock A (LHS of crate). More... | |
int | sdTestGetClockAStatus () |
Return the amount of clocks ticks that occurred for a two second period after the Clock A Mode was set. More... | |
int | sdTestGetClockAFreq () |
Return the Clock A Frequency. This test was bypassed during acceptance testing. More... | |
void | sdTestSetClkBPLL (int mode) |
Set the PLL mode for Clock B (LHS of crate). More... | |
int | sdTestGetClockBStatus () |
Return the amount of clocks ticks that occurred for a two second period after the Clock A Mode was set. More... | |
int | sdTestGetClockBFreq () |
Return the Clock B Frequency. This test was bypassed during acceptance testing. More... | |
void | sdTestSetTIBusyOut (int level) |
Set the Busy OUT level to the TI. More... | |
int | sdTestGetTITokenIn () |
Get the input level from the TI TokenIN. More... | |
void | sdTestSetTIGTPLink (int level) |
Set the GTP Link output to the TI. More... | |
unsigned int | sdTestGetClkACounter () |
Get the counter associated with the Clock A Frequency during period of 0.1ms. More... | |
unsigned int | sdTestGetClkBCounter () |
Get the counter associated with the Clock B Frequency during period of 0.1ms. More... | |
unsigned int | sdTestGetSWALoopback () |
Return the bit mask of levels sent from the SWA Module. This test was bypassed during acceptance testing. More... | |
int sdTestGetBusyout | ( | ) |
Return the mask of busy's asserted from the payload ports.
References SDStruct::busyoutTest, SDLOCK, and SDUNLOCK.
unsigned int sdTestGetClkACounter | ( | ) |
Get the counter associated with the Clock A Frequency during period of 0.1ms.
References SDStruct::clkACounterTest, SDLOCK, and SDUNLOCK.
unsigned int sdTestGetClkBCounter | ( | ) |
Get the counter associated with the Clock B Frequency during period of 0.1ms.
References SDStruct::clkBCounterTest, SDLOCK, and SDUNLOCK.
int sdTestGetClockAFreq | ( | ) |
Return the Clock A Frequency. This test was bypassed during acceptance testing.
References SDStruct::csrTest, SD_CSRTEST_CLKA_FREQ, SDLOCK, and SDUNLOCK.
int sdTestGetClockAStatus | ( | ) |
Return the amount of clocks ticks that occurred for a two second period after the Clock A Mode was set.
References SDStruct::csrTest, SD_CSRTEST_CLKA_TEST_STATUS, SDLOCK, and SDUNLOCK.
int sdTestGetClockBFreq | ( | ) |
Return the Clock B Frequency. This test was bypassed during acceptance testing.
References SDStruct::csrTest, SD_CSRTEST_CLKB_FREQ, SDLOCK, and SDUNLOCK.
int sdTestGetClockBStatus | ( | ) |
Return the amount of clocks ticks that occurred for a two second period after the Clock A Mode was set.
References SDStruct::csrTest, SD_CSRTEST_CLKB_TEST_STATUS, SDLOCK, and SDUNLOCK.
int sdTestGetSdLink | ( | ) |
Return the asserted level from the TI over the SDlink.
References SDStruct::sdLinkTest, SDLOCK, and SDUNLOCK.
unsigned int sdTestGetSWALoopback | ( | ) |
Return the bit mask of levels sent from the SWA Module. This test was bypassed during acceptance testing.
References SDStruct::csrTest, SD_CSRTEST_SWA_LOOPBACK_MASK, SDLOCK, and SDUNLOCK.
int sdTestGetTITokenIn | ( | ) |
Get the input level from the TI TokenIN.
References SDStruct::csrTest, SD_CSRTEST_TI_TOKENIN, SDLOCK, and SDUNLOCK.
int sdTestGetTokenIn | ( | ) |
Return payload port mask of those payload modules asserting TokenIN.
References SDLOCK, SDUNLOCK, and SDStruct::tokenInTest.
int sdTestGetTrigOut | ( | ) |
Return payload port mask of those payload modules asserting TrigOUT.
References SDLOCK, SDUNLOCK, and SDStruct::trigOutTest.
void sdTestSetClkAPLL | ( | int | mode | ) |
Set the PLL mode for Clock A (LHS of crate).
mode | PLL mode
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References SDStruct::csrTest, SD_CSRTEST_CLKA_FREQ, SD_CSRTEST_CLKB_FREQ, SD_CSRTEST_TEST_RESET, SDLOCK, and SDUNLOCK.
void sdTestSetClkBPLL | ( | int | mode | ) |
Set the PLL mode for Clock B (LHS of crate).
mode | PLL mode
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References SDStruct::csrTest, SD_CSRTEST_TEST_RESET, SDLOCK, and SDUNLOCK.
void sdTestSetStatBitBMask | ( | int | mask | ) |
Set StatBitB levels HI to those payload ports specified in mask.
mask | Mask to set StatBitB levels HI |
References SDLOCK, SDUNLOCK, and SDStruct::statBitBTest.
void sdTestSetTIBusyOut | ( | int | level | ) |
Set the Busy OUT level to the TI.
level | Busy Out level
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References SDStruct::csrTest, SD_CSRTEST_TEST_RESET, SD_CSRTEST_TI_BUSYOUT, SDLOCK, and SDUNLOCK.
void sdTestSetTIGTPLink | ( | int | level | ) |
Set the GTP Link output to the TI.
level | GTP Link output level
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References SDStruct::csrTest, SD_CSRTEST_TEST_RESET, SD_CSRTEST_TI_GTPLINK, SDLOCK, and SDUNLOCK.
void sdTestSetTokenOutMask | ( | int | mask | ) |
Set TokenOUT levels HI to those payload ports specified in mask.
mask | Mask to set TokenOUT levels HI |
References SDLOCK, SDUNLOCK, and SDStruct::tokenOutTest.